主要特性与技术指标___General FeaturesFlexible, expandable and upgradeable modular parametric instrument controlled via I/CV 3.0 Lite softwareUltra low current measurement without external preamplifiersFlexible to provide stable 100aA measurementsSwitch between CV and IV measurement without wasting time swapping cablesMeasurement Capabilities1 femtoamp current measurement resolution without external preamplifiers (High-Resolution SMU)100 attoamp current measurement resolution using HRSMU with Atto Sense & Switch Unit (ASU)10 femtoamp and 0.5 microvolt measurement resolution (Medium-Power SMU)+/- 200 Volts and +/- 1 Amp output by High-Power SMUI/CV 3.0 Lite Software CapabilitiDrivers for all of the popular semiautomatic wafer probersIntuitive GUI-based switching matrix control for the B2200A, B2201A, and E5250ATest sequencer for automating testing across an entire waferPost-test graphical analysis and wafer mapping capability
东莞市亚威电子仪器有限公司
联系人:李先生
手机: 13790101018
QQ：75508950
地址：东莞市塘厦镇花园中心
网址:www.ershouyiqi.com.cn