1)测量范围：
l                  DOI  a                      0至100
l                  长波(LW)            0至100
l                  短波(SW)            0至100
2)结构光谱：
l                  du                            <0.1mm
l                  wa                            0.1至0.3mm
l                  wb                            0.3至1.0mm
l                  wc                            1.0至3.0mm
l                  wd                            3.0至10.0mm
l                  we                            10.0至30.0mm
l                  重复性：                4%或>0.4      6%或>0.6
l                  重现性：                6%或>0.6      8%或>0.8
l                  扫描长度：            50/100/200mm
l                  分辨率：                375个测量点/厘米
l                  工作曲率：            R>500mm
l                  最小工件尺寸：    35mm×150mm
l                  测量时间：            4s
  
光源：                    激光二极管，LED和IR-SLED  
技术参数:  
1)测量范围：
                DOI  a                      0至100
                长波(LW)            0至100
                短波(SW)            0至100
2)结构光谱：
                du                            <0.1mm
                wa                            0.1至0.3mm
                wb                            0.3至1.0mm
                wc                            1.0至3.0mm
                wd                            3.0至10.0mm
                we                            10.0至30.0mm
                重复性：                4%或>0.4      6%或>0.6
                重现性：                6%或>0.6      8%或>0.8
                扫描长度：            50/100/200mm
                分辨率：                375个测量点/厘米
                工作曲率：            R>500mm
                最小工件尺寸：    35mm×150mm
                测量时间：            4s
光源：                    激光二极管，LED和IR-SLED